More Capability for the Industry’s Most Comprehensive Fiber Characterization System
At last year’s OFC 2015 in Los Angeles, Photon Kinetics, the world’s leading provider of innovative measurement solutions for optical fiber and cable manufacturers, introduced the 2300 Fiber Analysis System, the first fiber test instrument able to perform both cut-off wavelength (spectral loss) and fiber geometry measurements at the same test station. At this year’s OFC 2016 in Anaheim, Photon Kinetics added new specialty fiber geometry characterization capability to the 2300 for polarization maintaining, microstructured and large diameter optical fibers. It also released a new bare fiber loading option for the 2302 Coating Geometry System that eliminates the fiber holder loading step from the measurement process and, as a result, significantly reduces the setup time for what is already the industry’s fastest coating geometry measurement system.
“Since its introduction last year customer interest in the 2300 product family has exceeded our most optimistic expectations, and many fiber manufacturers are now benefitting from the its innovative measurement platform” , said Warren Hill, Vice-President, Marketing and Sales of Photon Kinetics. “The specialty fiber geometry options for the 2300 and the more ergonomic bare fiber option for the 2302 Coating Geometry System that we are releasing today are just the first of many new options planned for the 2300 product family. They exemplify Photon Kinetics’ commitment to providing solutions not only for our customer’s measurement issues, but also for the fiber handling challenges associated with those measurements.” Mr. Hill concluded, “We look forward to continuing to expand the 2300 product family in the coming years and strengthening its position as the new industry standard for fiber production measurements.”
The 2300 product family currently consists of the 2300 Fiber Analysis System, available in multiple
configurations, plus the 2302 Coating Geometry System and the 2311 Fiber Curl System.